Contaminant effect on cellular metabolic differential pressure curve: A quantitative analysis

M. Milani, M. Ballerini, L. Ferraro, M. Zabeo, M. Barberis, M. Cannone, Vera Faraone

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The possibility of using a pressure monitoring system based on differential pressure sensors to detect contaminant effects on cellular cultures metabolic activity is discussed using Saccharomyces cerevisiae cell cultures: differential pressure curves' shape, starting slope and maximum are affected both by physical and chemical contamination. Aim of the present study is the investigation of the effects generated by a 72 h exposition of Saccharomyces cerevisiae, human lymphocytes and AHH1 cellular line cultures to 50 Hz, 60 μT electromagnetic field. No significant differences have been recorded between irradiated and control yeast samples. On other hand irradiated lymphocytes samples, cultured in a PHA medium, grow less than control ones, but exhibit a greater metabolic activity: changes in the exposure system configuration influence neither sample growth differences nor metabolic response variations between control and irradiated samples. Control and irradiated lymphocyte samples, without PHA in culture medium, show the same behaviour both during irradiation and metabolic test. AHH1 control and irradiated samples show no difference both in growth percentage during irradiation and in metabolic test. Different cell cultures respond to the same stimulus in different manners.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsG.E. Cohn
Pages56-69
Number of pages14
Volume4625
DOIs
Publication statusPublished - 2002
EventClinical Diagnostic Systems: Technologies and Instrumentation - San Jose, CA, United States
Duration: Jan 22 2002Jan 24 2002

Other

OtherClinical Diagnostic Systems: Technologies and Instrumentation
Country/TerritoryUnited States
CitySan Jose, CA
Period1/22/021/24/02

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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